Nanometer precision metrology and constraint of thin optics for a high resolution x-ray telescope
M. Akilian, C.-H. Chang, C. Chen, C.R. Forest, R.K. Heilmann, C. Joo, P. Konkola, J. Montoya, Y. Sun, and M.L. Schattenburg, Nanometer precision metrology and constraint of thin optics for a high resolution x-ray telescope, Institute for Experimental Physics, Technische Universität Graz, Graz, Austria, July 15, 2004.