Metrology of thin transparent optics using Shack-Hartmann wavefront sensing

C.R. Forest, C.R. Canizares, D.R. Neal, M. McGuirk, and M.L. Schattenburg, Metrology of thin transparent optics using Shack-Hartmann wavefront sensing, Optical Engineering, Vol. 43(3), p. 742-753, March 2004.